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ECE · Q235

Electronic Devices And Circuits

Engineering and GATE · ECE · question 235

Q235

Consider avalanche breakdown in a silicon p+n junction. The n-region is uniformly doped with a donor density ND. Assume that breakdown occurs when the magnitude of the electric field at any point in the device becomes equal to the critical field Ecrit. Assume Ecrit to be independent of ND. If the built-in voltage of the p+n junction is much smaller than the breakdown voltage, VBR, the relationship between VBR and ND is given by

A.
B.
C.
Answer
D.

Answer: Option C

Solution

Answer: Option C
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