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Metallurgical Engineering · Q25

Physics of Metals in Metallurgy

Engineering and GATE · Metallurgical Engineering · question 25

Q25

Which one of the following signals from a specimen is used in a scanning electron microscope to get quantitative elemental analysis?

A.
Secondary electrons
B.
Backscattered electrons
C.
X-rays
Answer
D.
Transmitted electrons

Answer: Option C

Solution

Answer: Option C
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