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ECE · all questions

Electronic Devices And Circuits
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Storage time of a transistor is the time taken for the collector curves to fall to

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A zener diode, when used in voltage stabilization circuits, is biased in

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Consider the following statements for a photo conducting material:
1. Its dark conductivity is small.
2. With the absorption of radiation, equal numbers of electrons and holes are produced.
Which of the statements given above is/are correct?

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A switched mode power supply operating at 20 kHz to 100 kHz range used as the main switching element is

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If a certain Zener diode has a Zener voltage of 3.6 V and reverse bias voltage of 5 V is applied across it, the Zener operates in . . . . . . . .

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Electronic distribution of an Si atom is

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The resistivity of a metal is a function of temperature because

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By increasing temperature, the electrical conductivity would:

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The speed power product for static CMOS is:

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A long-channel NMOS transistor is biased in the linear region with VDS = 50 mV and is used as a resistance. Which one of the following statements is NOT correct?

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Which one of the following is not LED material?

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When donor atoms are added to semiconductor, it

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In a p-n-p transistor biased in the active region, in the n-type base, holes

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In transistor, if electrons flow into emitter,

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Energy band gap of an insulating materials is:

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Effectively, how many valence electrons are there in each atom within a silicon crystal?

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Which of the following are essentials of a transistor biasing circuit?
1. Proper zero signal collector current flow
2. VCE should not fall below 0.5 V for Germanium and 1 V for Silicon
3. Ensure stabilization of operating point
4. Loading to the source

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Which one of the following is the exact expression for ICEO (i.e. collector to emitter current with base open) in a junction transistor?
(Where ICBO is the collector to base current with emitter open, and α is the common base current gain)

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The light output of LED varies as (Current)n, the value of n is about

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Which one of the following expressions may be used to correctly describe the temperature (T) variation of the intrinsic carrier density (ni) of a semiconductor?
Eg is the band gap, A is pre-factor's k is Boltzmann constant.

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